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This small voltage is processed through a high-quality amplifier, which produces an analog signal that is proportional to the applied flux density. Hall-effect elements respond to stress by modifying the output voltage versus the magnetic flux-density curve. For this reason, it is important that designers, from chip to final customer, understand that environmental stress from thermal or mechanical sources can affect the output of a Hall-effect element.
The chip designer anticipates the end use, builds compensation circuits, and connects multiple Hall elements in such a manner as to minimize the effects of the anticipated environment. When the proper IC design is matched with the proper package design, environmental effects are minimized.
Although robust design techniques greatly reduce the effects that package stresses may place on the operation of the Hall-effect IC, it is important that assembly manufacturers take precautions to avoid unnecessary external stresses such as those caused by overmolding, gluing, welding, lead bending or forming,lead clipping or trimming, or clamping. In addition to avoiding stresses which affect the electrical parameters, it is also essential to avoid stresses which could introduce any reliability risks.
This application note provides design guidelines for subassemblies to avoid both of these problems.
While this document covers most of the assembly methods used for mounting Hall-effect devices, it does not cover soldering to conventional circuit boards. There are several locations on a package which are vulnerable to stress, as shown in figure 1. Regardless of the method used for building a subassembly, it is important to minimize the stress in these areas.
Stress-sensitive locations. The die may fail immediately, or it may have a crack which is a latent defect.
See the Design Validation Testing section for information on finding latent defects. Forces over the die can also cause electrical parameter shift.
If force must be applied to the die face, it should be distributed evenly over the entire top surface. These wires are extremely small, having a cross-sectional area that is approximately one-ninth that of a human hair see figure 2. The "neck" of the wedge bond is even smaller, being about one-fourth of the cross-sectional area of the wire. Any deformation or movement of the molding compound relative to the wire can cause damage, as shown in figure 2 right panel.
Again, it may cause an immediate failure or a latent defect. Right The "neck" thickness of the wedge bond is approximately one-fourth that of the bond wire, and is the most likely point of failure. Inside of the package, only a small portion of the leads is embedded into the molding compound. In the case of the K package, shown in figure 3, only 0. The resulting lever arm amplifies the force on the lead by a factor of nineteen so that even a small force can damage the wedge bonds.
Because of this, it is important to follow the lead clamping guidelines during lead forming, and to avoid forces on the leads during other processing steps. It is important to clamp the leads before any lead-forming operations. Because of the leverage effect, even a small load applied to the end of the lead is multiplied in this package, by 19 times , and produces a large load at the wedge bond.
Lead-forming operations at the customer facility are often a necessary part of preparing Hall-effect devices for use in applications. For most Allegro devices, the few simple precautions described in the next section, Standard Forming Procedures , will ensure that lead-forming does not induce damaging stress to the leads, the epoxy case, or the internal IC. While these precautions should always be taken into consideration, exceptions exist for certain Allegro gear tooth sensor IC ATS packages with enhanced lead support. A few simple precautions will ensure that lead-forming does not induce damaging stress to the leads, the epoxy case, or the internal IC.
Certain Allegro gear tooth sensor IC ATS packages are designed so that they can incorporate the Hall sensor IC with other components, such as a pole piece or back-biasing rare-earth pellet, as an optimized device. Leave the molded lead bar attached during the lead-forming operation. Do not remove the bar until all forming of the leads is complete. This will prevent the leads from spreading apart and will optimize lead planarity and spacing.
Molded lead bar used to constrain leads on some packages for handling. As mentioned in the previous sections, the lead must be clamped sufficiently to prevent pulling on the leads during forming.
Inspecting the "witness marks" left in the plating can show whether or not the clamping was adequate. When the compound is heated above its T g level, it experiences a very significant reduction in its strength.
Hall Effect Sensors are devices which are activated by an external magnetic field. We know that a magnetic field has two important characteristics flux density. A Hall effect sensor is a device that is used to measure the magnitude of a magnetic field. . Hall-effect sensors: theory and applications (2, illustrated ed.). Elsevier. ISBN ^ Popović, R. S. (). Hall effect devices (2 , illustrated ed.).
Because of this, when the temperature of any process exceeds T g , care must be taken not to apply loads to any of the locations shown in figure 1. In addition to low strength above T g , the molding compound also experiences viscoplasticity creep , which allows the compound to deform slowly over time. Care must be taken not to deform the leads so that they become "spring-loaded," because subsequent high-temperature processing can result in lead movement, which also can result in damage to the wedge bonds.
When a process requires that a formed lead be soldered or welded, there are three main rules to keep in mind:. If there are concerns that a given process or design may be creating high stresses in the leads, which could be causing a reliability risk, refer to the Design Validation Testing section for information on methods for finding latent defects.
That includes guidelines on lead finishes, solders, fluxes, contaminants to avoid, and general processing parameters.
As described in this section, welding should be approached with careful attention, planning, and process testing because of the small geometries of the device cases and plating. There are two welding methods that have been used with success, conventional resistance welding, and a type of welding process called tin-fusing Sn-fusing.
The choice of process may be determined by the application and by production conditions. Damage caused by excessive heat during welding, which includes deformation of the base metal and flow of the tin plating.
There is very little damage, and the pull strength of the joint is essentially the same as the overheated leads in figure 7. Damage caused by lead flattening resulting from welding leads that are too short. Welding tin-plated copper leads onto a copper leadframe is possible, using a laser. The considerations are similar to tin fusing; thus, avoiding excessive power is important.
Because a laser spot is focused to a very small area, care must be taken to ensure that the resulting bond surface area is sufficient to make a strong bond. Allegro has taken steps to provide a good tin plate for tin-fusing welding. This reduced thickness allows better control of the plating bath parameters and gives a superior quality finish with excellent solderability.
It is also better for tin-fusing because there is less tin to melt, so spattering is controlled. To make this voltage value usable, an amplification stage amplifies the differential voltage and rejects any common-mode signal, which is why you need a differential amplifier for this stage. Figure 2 presents the typical components of a Hall-effect sensor.
Different Hall-effect sensors use the output of the differential amplifier in numerous ways to achieve various functions.
Basic Hall-effect sensor building blocks include a power source, the Hall element, and an op amp. Hall-effect sensors have proved to be one of the most popular magnetic field sensors for several reasons:. These features translate into various electrical and magnetic specifications in a particular device data sheet. Also, TI has a TechNote on the benefits of low power consumption.
Hall-effect sensors are configurable for different applications. They can generally be classified into two categories: threshold-based and linear. Linear Hall-effect sensors can respond to either magnetic poles or one pole to increase device sensitivity.
The carrier density in a graphene device is here controlled by an electrostatic field induced by a nearby metallic gate, as is often the case. On top of this, the bandwidth which the signal is taken from is also important in terms of how much noise is going to be created — the wider in terms of the frequency range, the more noise. Other applications of the Hall multiplier include analogue computation, DC to AC conversion, modulation, frequency doubling, squared function generator, and others. Full copyright notice and terms of use. Simply put, this circuit converts
Also, the output can be either unmodulated a linear analog voltage signal or modulated a pulse-width-modulation [PWM] signal with a varying duty cycle to enable use in noisy environments. Figure 4 shows the transfer functions of various linear Hall-effect sensors. Sensor output can follow the linear ratiometric Hall-effect sensor transfer function top or be used to generate a PWM signal bottom. The report profiles major companies active in this field. This report provides the competitive landscape of the key players that covers the key growth strategies.
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