Anomalous X-Ray Scattering for Material Characterization: Atomic-Scale Structure Determination
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About this product Product Information The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics.
In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood.
Information on the surface structure or the number density of atoms in the near surface region may provide better insight.
Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys," have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than K.
In these alloy systems, one can obtain a sample thickness of several centime ters.
Transforming X-ray detection with hybrid photon counting detectors
Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions. Additional Product Features Number of Volumes. Structural Characterization of Crystalline and Non-crystalline Material.
Anomalous Small-Angle X-ray Scattering. Anomalous Grazing-Incidence X-ray Reflection. Show More Show Less. No ratings or reviews yet.
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Anomalous X-Ray Scattering for Materials Characterization. Atomic-Scale Structure Determination. Authors: Waseda, Yoshio. Free Preview. Y. Waseda. Anomalous X-Ray Scattering for Materials Characterization. Atomic- Scale Structure Determination. Series: Springer Tracts in Modern Physics, Vol.
Open Borders Inc. Save on Nonfiction Trending price is based on prices over last 90 days. The anomalous X-ray scattering AXS method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems.
AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization.
X-ray crystallography
It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc. Help Centre. My Wishlist Sign In Join. Be the first to write a review. Add to Wishlist.
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Description Table of Contents Product Details Click on the cover image above to read some pages of this book! All Rights Reserved. In Stock.
- Introduction.
- Anomalous X-Ray Scattering for Materials Characterization : Atomic-Scale Structure Determination?
- Pragmatics and the English language!
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